Material fabrication processes can gradually create changes in the material’s final properties; thus, to verify the material’s final quality and comprehend any inconsistencies, scientists need a ...

For materials scientists, understanding the atomic structure of a material, revealing defects, or characterizing the chemical and physical processes that occur during the creation of material, are key ...

ZEISS has unveiled the new ZEISS Crossbeam 750 focused ion beam-scanning electron microscope (FIB-SEM) that is optimized for demanding sample preparation. It provides a live, high-resolution “see ...

The family of electron microscopy techniques have become staple methods for imaging nanoscale objects, including nanoparticles, viruses and proteins. The appeal of electron microscopy as a ...

TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...

Prepare samples by coating, drying, etching, milling, polishing, and sectioning. The Leica CPD 030 Critical Point Dryer is a critical point drying device for biological and industrial samples. It uses ...

ZEISS Crossbeam 750 FIB-SEM advances live, high-resolution "see while you mill” capability, providing unmatched feedback for precision endpointing in sample preparation workflows. New ZEISS Gemini 4 ...

In this interview, News Medical speaks with Rhea Stringer, Electron Microscopist at the John Innes Centre, about the role of electron microscopy in biological imaging. Rhea discusses how advanced ...

CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...

Zeiss has unveiled the new Zeiss Crossbeam 750 focused ion beam-scanning electron microscope (FIB-SEM), optimised for ...